ON FUNCTIONAL OPTIMIZED SIGNAL PROBABILITIES OF PRIMARY INPUTS IN RANDOM TESTING

An approach to obtaining optimized signal probabilities of PIS is presented at the functional level. A design for testability is offered to preprocess the Circuit Under Test (CUT). An algorithm to produce Maximal Supergate ( MSG ) is given to reduce a circuit to a tree s e. The computing complexity is decreased, which greatty improves [l].

Project Supported:

Clc Number:

TN707