Analysis on the Illumination and Contrast of Imaging Deflection Measuring System
CSTR:
Clc Number:

TB133

  • Article
  • | |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • | |
  • Comments
    Abstract:

    The principle of photoelectric imaging deflection measurement system are presented. The calculation of the image plane's illuminance and contrast are discussed. The relationship among the system's parameters are analyzed. The feasibility of high reflectivital material replacing the system's source are also discussed when illuminance on the ground is high. The result contributes to selecting the parameters of photoelectric imaging deflection measurement system and achieves the long online of deflection.

    Reference
    Related
    Cited by
Get Citation

鲁进,夏哲,朱永.光电成像挠度测量系统的照度和对比度分析[J].重庆大学学报,2004,27(12):28~31

Copy
Related Videos

Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Revised:March 08,2004
Article QR Code