Analysis on Micro-structure of TiN Thin Film and Polyimide with AFM
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    Abstract:

    The study in molecular morphology is given with a highresolution Atomic Force Microscope AFM.IPC-208B.By taking TiN thim film prepared by magnerton sputtering method and polymide(PI) fibre for examples,the preferenthal growing plme of TiN thin film,the atomic arranges of TiN thin film on the preferential growing plme and the surficial micro-structure can be ascertained form the three-dimensional images obtamed by AFM.IPC-208B.These experiments not only identify small structures of the materials,but also affirm that AFM.IPC-208B holds the precision of atomic level and potential application in micro-structure field,at the same time it establishs the groundwork for the application in micro-process kingdom.

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白海会 杨学恒 彭光含. AFM对TiN薄膜和聚酰亚胺微观结构的分析[J].重庆大学学报,2006,29(8):138~140145

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  • Received:March 10,2006
  • Revised:March 10,2006
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