国家自然科学基金面上项目(51077137)；国际科技合作计划资助项目(2010DFA72250)
绝缘栅双极型晶体管(IGBT)模块是电力电子装置中关键可靠性敏感元件之一，辨识IGBT模块缺陷，是避免突发故障，增强电力电子装置可靠运行的重要举措之一。为此，笔者提出一种基于时间序列动态时间弯曲(DTW)差异的IGBT模块早期缺陷的诊断方法。该方法利用缺陷对IGBT模块门极寄生参数的影响，通过分析缺陷前后，门极电压信号序列DTW的差异，判断IGBT模块内部是否存在缺陷。实验研究结果验证了其诊断结论的正确性和实用性。
Insulated gate bipolar transistor(IGBT) is one of the key reliability sensitive components of power electronic equipment. Developing prognostic method for defects in an IGBT module is an important measure to enhance the reliability lever of IGBTs. Therefore，a novel prognostic method based on dynamic time warping(DTW) deviations of time series is presented. This method utilizes variations of DTW of gate voltage series caused by defects to estimate if any defect existes in an IGBT module before breakdown. And application value is verified by test results.
周生奇,周雒维,孙鹏菊.基于时间序列DTW差异的IGBT模块缺陷辨识方法[J].重庆大学学报,2013,36(9):89-95.
复制
