Study on Functional Testing State Sets for 32-bit Microprocessors
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摘要:
基于微处理器指令译码功能故障模型，给出了各类指令所需的测试状态集应该具有的性质及其构造方法。
Abstract:
Based on the functional fault model of instruction decoding in microprocessors,this paper Slyes the properties of the tasting state set should have for any type of instructions and presents the method to construct such testing state sets.